RD53B Wafer Testing for the ATLAS ITk Pixel Detector

نویسندگان

چکیده

RD53B/ITkPix-V1 is the most recent hybrid pixel readout chip development for ATLAS detector at HL-LHC. It first full-scale 65 nm pixel-readout of its kind. ITkPix-V1 consists more than one billion transistors with a high memory triplication ratio to cope particle density heart ATLAS. Chips will be as close interaction point possible optimize resolution impact parameters. The features 5-Gbit connection, special data compression deal hit intensities. In addition, low-power, low-noise analog front-end used ensure speeds and low detection thresholds. Failure chips in would problematic. Therefore, thorough test necessary before during production. For this purpose, Bonn group has developed BDAQ53, fast versatile simulation testing environment that allows small large-scale successor chips. This conference note give an overview while focusing on wafer evaluate ITkPix-V1’s suitability deployment

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ژورنال

عنوان ژورنال: Journal of physics

سال: 2022

ISSN: ['0022-3700', '1747-3721', '0368-3508', '1747-3713']

DOI: https://doi.org/10.1088/1742-6596/2374/1/012087